The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Apr. 22, 2022
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kevin Ryan, Albany, NY (US);

Hirokazu Aizawa, Albany, NY (US);

Kaoru Maekawa, Albany, NY (US);

Satohiko Hoshino, Albany, NY (US);

Yoshihiro Tsutsumi, Albany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/56 (2006.01); H01L 21/683 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/568 (2013.01); H01L 21/561 (2013.01); H01L 21/6835 (2013.01); H01L 24/96 (2013.01); H01L 2221/68309 (2013.01); H01L 2221/68318 (2013.01); H01L 2221/68381 (2013.01); H01L 2224/96 (2013.01);
Abstract

A method for making forming a semiconductor package comprises forming a plurality of alignment marks in or on a carrier substrate; positioning and bonding a plurality of semiconductor dies to the carrier substrate based on the plurality of alignment marks; further processing the plurality of semiconductor dies into a reconstituted wafer; and decoupling the reconstituted wafer from the carrier substrate at an interface using a laser source. The alignment marks are interposed between the interface and the laser source.


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