The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Feb. 16, 2024
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Joseph M. Mccrate, Boise, ID (US);
Marco Sforzin, Cernusco Sul Naviglio, IT;
Paolo Amato, Treviglio, IT;
Brian M. Twait, Meridian, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 11/1004 (2013.01); G06F 11/1016 (2013.01);
Abstract
A redundant array of independent disks (RAID) protection can be provided along with other types of error correction code (ECC) schemes that can correct residual bit errors. The bit errors correctable by the ECC schemes not only include those errors that have been existing in input data used for the RAID process, but also those bit errors may have been propagated due to the existing errors.