The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Jul. 29, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Satoshi Itoh, Yamanashi, JP;

Hiroyuki Ikuta, Yamanashi, JP;

Yoshiyuki Kondo, Yamanashi, JP;

Hideki Yuasa, Yamanashi, JP;

Soudai Emori, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/509 (2006.01); C23C 16/511 (2006.01); H01J 37/32 (2006.01); C23C 16/34 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32311 (2013.01); C23C 16/509 (2013.01); C23C 16/511 (2013.01); H01J 37/32174 (2013.01); H01L 21/0217 (2013.01); H01L 21/02274 (2013.01); C23C 16/345 (2013.01);
Abstract

A plasma processing apparatus for generating plasma from a processing gas using microwaves and performing plasma processing on a substrate is provided. The apparatus includes a processing chamber having a substrate support on which the substrate is placed; a plurality of microwave radiation units arranged at a central portion and an outer peripheral portion of a ceiling wall of the processing chamber and configured to radiate microwaves; and a controller configured to complete microwave radiation from the microwave radiation unit in the central portion upon completion of plasma processing of the substrate and then complete microwave radiation from the microwave radiation units in the outer peripheral portion.


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