The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 17, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Yu-Hung Lin, Taichung, TW;

Jih-Churng Twu, Hsinchu, TW;

Su-Chun Yang, Hsinchu, TW;

Shih-Peng Tai, Xinpu Township, TW;

Yu-Hao Kuo, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 84/03 (2025.01); H01L 21/3065 (2006.01); H01L 21/311 (2006.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 23/498 (2006.01); H01L 25/065 (2023.01); H10D 88/00 (2025.01);
U.S. Cl.
CPC ...
H10D 84/038 (2025.01); H01L 21/3065 (2013.01); H01L 21/31116 (2013.01); H01L 21/561 (2013.01); H01L 23/3128 (2013.01); H01L 23/49827 (2013.01); H01L 24/05 (2013.01); H01L 24/11 (2013.01); H01L 24/32 (2013.01); H01L 25/0657 (2013.01); H10D 88/01 (2025.01); H01L 2224/05024 (2013.01); H01L 2224/05647 (2013.01); H01L 2224/11462 (2013.01); H01L 2224/11612 (2013.01); H01L 2224/32146 (2013.01); H01L 2224/32235 (2013.01); H01L 2225/06513 (2013.01); H01L 2225/06541 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/182 (2013.01);
Abstract

A method includes bonding a first semiconductor die and a second semiconductor die to a substrate, where a gap is disposed between a first sidewall of the first semiconductor die and a second sidewall of the second semiconductor die, performing a plasma treatment to dope top surfaces and sidewalls of each of the first semiconductor die and the second semiconductor die with a first dopant, where a concentration of the first dopant in the first sidewall decreases in a vertical direction from a top surface of the first semiconductor die towards a bottom surface of the first semiconductor die, and a concentration of the first dopant in the second sidewall decreases in a vertical direction from a top surface of the second semiconductor die towards a bottom surface of the second semiconductor die, and filling the gap with a spin-on dielectric material.


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