The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Jun. 20, 2023
Stmicroelectronics International N.v., Geneva, CH;
Venkata Narayanan Srinivasan, Greater Noida, IN;
Shiv Kumar Vats, Greater Noida, IN;
Umesh Chandra Srivastava, Greater Noida, IN;
STMicroelectronics International N.V., Geneva, CH;
Abstract
According to an embodiment, a method for testing a scan chain is provided. The method includes receiving a first clock signal and a first scan enable signal and generating a second and third clock signal based on the first clock signal and the first scan enable signal. The third clock signal is delayed by a clock pulse from the second clock signal. The first, second, and third clock signal have the same duty cycle. The method further includes providing the second clock signal and the second scan enable signal to, respectively, a clock terminal and scan enable input of a first scan flip-flop of the scan chain. The method further includes providing the third clock signal and a third scan enable signal to, respectively, a clock terminal and a scan enable input of a last scan flip-flop of the scan chain.