The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Jun. 10, 2024
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Kai-Hsuan Lee, Hsinchu, TW;

Feng-Cheng Yang, Hsinchu County, TW;

Yen-Ming Chen, Hsin-Chu County, TW;

Sai-Hooi Yeong, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 21/285 (2006.01); H01L 21/3105 (2006.01); H01L 21/764 (2006.01); H01L 27/088 (2006.01); H10D 30/62 (2025.01); H10D 62/10 (2025.01); H10D 64/01 (2025.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H10D 84/83 (2025.01);
U.S. Cl.
CPC ...
H10D 84/038 (2025.01); H01L 21/28518 (2013.01); H01L 21/31055 (2013.01); H01L 21/764 (2013.01); H10D 30/62 (2025.01); H10D 62/115 (2025.01); H10D 64/015 (2025.01); H10D 84/013 (2025.01); H10D 84/0135 (2025.01); H10D 84/0147 (2025.01); H10D 84/0149 (2025.01); H10D 84/0151 (2025.01); H10D 84/0158 (2025.01); H10D 84/834 (2025.01);
Abstract

A method includes providing a workpiece including a gate structure (MG), a first spacer along a sidewall of the MG, a second spacer along a sidewall of the first spacer, and a source/drain (S/D) feature adjacent to the second spacer. The method further includes forming a contact trench over the S/D feature, removing the second spacer to form an air gap between the MG and the S/D feature, depositing a first dielectric layer over the S/D feature and partially filling the air gap, removing a portion of the first dielectric layer to expose a central portion of a top surface of the S/D feature while a side portion of the top surface of the S/D feature remains under the first dielectric layer, forming an S/D contact in the contact trench, removing the first dielectric layer to extend the air gap, and depositing a second dielectric layer over the air gap.


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