The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Mar. 18, 2024
Applicant:

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Sandeep Jain, Noida, IN;

Shalini Pathak, Gurgaon, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3181 (2006.01); G06F 30/30 (2020.01); G06F 30/33 (2020.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/31813 (2013.01); G01R 31/318541 (2013.01); G01R 31/318547 (2013.01); G01R 31/318566 (2013.01); G06F 30/30 (2020.01); G06F 30/33 (2020.01);
Abstract

According to an embodiment, a method for testing using scan chains, without an independent scan enable pin, is proposed. The method includes selectively indicating a capture phase and a load/unload phase for the scan chain based on an encoding of a scan enable signal in an expected signal and a masking signal; loading test parameters to the scan chain during the load/unload phase; operating the scan chain under functional mode during the capture phase; and generating an error signal based on comparing an output of the scan chain during an unload phase with the expected signal, wherein the masking signal is used to mask the output of the scan chain for cycles with invalid results.


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