The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jun. 13, 2024
Winbond Electronics Corp., Taichung, TW;
Winbond Electronics Corp., Taichung, TW;
Abstract
A test device and a testing method for a memory are provided. The test device includes a selection signal generator and a plurality of test pattern generators. The selection signal generator receives a test signal via a signal input end and detects a voltage variation on the test signal to generate a test mode selection signal. The test pattern generators are coupled between the selection signal generator and a row decoder of the memory device. The test pattern generators receive the test mode selection signal, and one of the test pattern generators is activated according to the test mode selection signal to perform a test operation on at least one of a plurality of memory cell rows in the memory device.