The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Aug. 03, 2023
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Wei Cao, Fremont, CA (US);

Weiyi Li, Fremont, CA (US);

Dengtao Zhao, Los Gatos, CA (US);

Xiang Yang, Santa Clara, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/24 (2006.01); G11C 16/30 (2006.01);
U.S. Cl.
CPC ...
G11C 16/102 (2013.01); G11C 16/08 (2013.01); G11C 16/24 (2013.01); G11C 16/30 (2013.01);
Abstract

A memory device is provided and includes a memory block that has a plurality of memory cells that are arranged in a plurality of word lines. The memory device also includes a plurality of word line switch transistors that are electrically coupled with the plurality of word lines, where the plurality of word lines are grouped into a plurality of zones based on a size of a word line switch transistor associated with each word line of the plurality of word lines. The memory device also includes a bitline biasing circuit for providing a negative biasing voltage to a bitline corresponding to a memory cell of the selected word line during programming of the selected word line and the bitline biasing circuit is configured to set a magnitude of the negative biasing voltage based on which zone of the plurality of zones the selected word line is in.


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