The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Aug. 05, 2021
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Wei-Yu Tsai, Hsinchu, TW;

Fu-Yao Nien, Hsinchu, TW;

Hong-Wei Huang, Hsinchu, TW;

Chang-Sheng Lee, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 64/01 (2025.01); H01L 21/02 (2006.01); H01L 21/28 (2025.01); H01L 21/3065 (2006.01); H10D 30/01 (2025.01); H10D 30/60 (2025.01); H10D 30/62 (2025.01); H10D 62/00 (2025.01); H10D 64/27 (2025.01);
U.S. Cl.
CPC ...
H10D 64/027 (2025.01); H01L 21/02658 (2013.01); H01L 21/28114 (2013.01); H01L 21/3065 (2013.01); H10D 30/024 (2025.01); H10D 30/026 (2025.01); H10D 30/611 (2025.01); H10D 30/6211 (2025.01); H10D 30/6215 (2025.01); H10D 30/6217 (2025.01); H10D 30/6219 (2025.01); H10D 62/021 (2025.01); H10D 64/017 (2025.01); H10D 64/018 (2025.01); H10D 64/518 (2025.01);
Abstract

A semiconductor device includes a substrate, an isolation structure on the substrate, a fin protruding from the substrate and through the isolation structure, a gate stack engaging the fin, and a gate spacer on sidewalls of the gate stack. The gate spacer includes an inner sidewall facing the gate stack and an outer sidewall opposing the inner sidewall. The inner sidewall has a first height measured from a top surface of the fin and a bowed structure in a top portion of the inner sidewall. The bowed structure extends towards the gate stack for a first lateral distance measured from a middle point of the inner sidewall. The first lateral distance is less than about 8% of the first height.


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