The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

May. 20, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Yen-Tien Tung, Hsinchu, TW;

Szu-Wei Huang, Hsinchu, TW;

Zhi-Ren Xiao, Hsinchu, TW;

Yin-Chuan Chuang, Hsinchu, TW;

Yung-Chien Huang, Hsinchu, TW;

Kuan-Ting Liu, Hsinchu, TW;

Tzer-Min Shen, Hsinchu, TW;

Chung-Wei Wu, Hsin-Chu County, TW;

Zhiqiang Wu, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 21/3205 (2006.01); H01L 29/423 (2006.01); H01L 29/49 (2006.01); H01L 29/51 (2006.01); H01L 29/786 (2006.01); H10D 30/67 (2025.01); H10D 64/01 (2025.01); H10D 64/66 (2025.01); H10D 64/68 (2025.01);
U.S. Cl.
CPC ...
H10D 64/01 (2025.01); H01L 21/32053 (2013.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 64/667 (2025.01); H10D 64/691 (2025.01);
Abstract

A semiconductor structure includes a substrate and a semiconductor channel layer over the substrate. The semiconductor structure includes a high-k gate dielectric layer over the semiconductor channel layer, a work function metal layer over the high-k gate dielectric layer, and a bulk metal layer over the work function metal layer. The work function metal layer includes a first portion and a second portion over the first portion. Both the first portion and the second portion are conductive. Materials included in the second portion are also included in the first portion. The first portion is doped with silicon at a first dopant concentration, and the second portion is not doped with silicon or is doped with silicon at a second dopant concentration lower than the first dopant concentration.


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