The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Mar. 08, 2023
Applicant:

Plasma-therm Nes Llc, St. Petersburg, FL (US);

Inventors:

Sarpangala Hariharakeshava Hegde, Fremont, CA (US);

Armin Baur, Largo, FL (US);

Wei-Hua Hsiao, St. Petersburg, FL (US);

Russell Westerman, Land O' Lakes, FL (US);

Jerome Michael Buckley, St. Petersburg, FL (US);

Assignee:

PLASMA-THERM NES LLC, St. Petersburg, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/60 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
H01L 23/60 (2013.01); H01L 21/3065 (2013.01);
Abstract

The present disclosure provides several methods for processing a substrate within a shutterless ion beam etching (IBE) system or shutterless ion assist ion beam deposition (IBD) system while preventing electrostatic damage to the substrate. In the IBE, at an etch completion, the ion energy to the ion source is reduced to less than 20 electron volts while at least one of the devices of the plurality of devices on the top surface of the substrate is exposed to a portion of the ion beam. In the IBD, at a deposition ion assist completion, the ion energy from the second ion source is reduced to less than 20 electron volts while at least one of the devices of the plurality of devices on the top surface of the substrate is exposed to the second ion beam.


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