The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Apr. 27, 2022
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

I-Hsuan Chen, Taichung, TW;

Ying-Hao Wang, Tainan, TW;

Chien-Lung Chen, Zhubei, TW;

Chien-Chi Tzeng, Hsinchu, TW;

Hu-Wei Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 1/44 (2006.01); G01N 21/95 (2006.01); G01N 35/00 (2006.01); G06T 7/70 (2017.01); H01L 21/66 (2006.01); H04N 25/71 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 1/44 (2013.01); G01N 21/9501 (2013.01); G01N 35/00 (2013.01); G06T 7/70 (2017.01); H01L 22/12 (2013.01); H04N 25/71 (2023.01); G01N 2035/00346 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A method includes forming a package component, the package component comprising an integrated circuit die, attaching the package component to a package substrate; placing a heat spreader over the package component and the package substrate to form an integrated circuit package, wherein a height of the integrated circuit package is in a range from 2.5 mm to 6 mm, and performing a first automatic optical inspection (AOI) process on the integrated circuit package using an AOI apparatus to determine if the orientation and alignment of the heat spreader with regards to the package substrate is within specification, wherein the AOI apparatus comprises a lens that has a maximum depth of field that is greater than the height of the integrated circuit package, and wherein during the first AOI process the depth of field encompasses an entirety of the height of the integrated circuit package.


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