The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Aug. 07, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Shih-Hao Lin, Hsinchu, TW;

Chih-Chuan Yang, Hsinchu, TW;

Chih-Hsuan Chen, Hsinchu, TW;

Bwo-Ning Chen, Keelung, TW;

Cha-Hon Chou, Hsinchu, TW;

Hsin-Wen Su, Hsinchu, TW;

Chih-Hsiang Huang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/00 (2025.01); H01L 21/02 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H10D 30/01 (2025.01); H10D 30/67 (2025.01); H10D 62/00 (2025.01); H10D 62/10 (2025.01); H10D 62/80 (2025.01); H10D 62/832 (2025.01); H10D 64/01 (2025.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H10D 84/85 (2025.01); H10B 10/00 (2023.01);
U.S. Cl.
CPC ...
H10D 30/6713 (2025.01); H01L 21/0259 (2013.01); H01L 21/26513 (2013.01); H01L 21/2652 (2013.01); H01L 21/266 (2013.01); H10D 30/031 (2025.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 62/021 (2025.01); H10D 62/118 (2025.01); H10D 62/121 (2025.01); H10D 62/80 (2025.01); H10D 62/832 (2025.01); H10D 64/017 (2025.01); H10D 64/018 (2025.01); H10D 84/0167 (2025.01); H10D 84/017 (2025.01); H10D 84/0184 (2025.01); H10D 84/038 (2025.01); H10D 84/85 (2025.01); H10B 10/125 (2023.02);
Abstract

A method of fabricating a device includes providing a fin element in a device region and forming a dummy gate over the fin element. In some embodiments, the method further includes forming a source/drain feature within a source/drain region adjacent to the dummy gate. In some cases, the source/drain feature includes a bottom region and a top region contacting the bottom region at an interface interposing the top and bottom regions. In some embodiments, the method further includes performing a plurality of dopant implants into the source/drain feature. In some examples, the plurality of dopant implants includes implantation of a first dopant within the bottom region and implantation of a second dopant within the top region. In some embodiments, the first dopant has a first graded doping profile within the bottom region, and the second dopant has a second graded doping profile within the top region.


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