The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Feb. 05, 2024
Micron Technology, Inc., Boise, ID (US);
Vamsi Pavan Rayaprolu, Santa Clara, CA (US);
Mustafa N. Kaynak, San Diego, CA (US);
Sivagnanam Parthasarathy, Carlsbad, CA (US);
Patrick Khayat, San Diego, CA (US);
Sampath Ratnam, San Jose, CA (US);
Kishore Kumar Muchherla, Fremont, CA (US);
Jiangang Wu, Milpitas, CA (US);
James Fitzpatrick, Laguna Niguel, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising performing a data integrity check on a source set of memory cells, configured to store a first number of bits per memory cell, to obtain a data integrity metric value; responsive to determining that the data integrity metric value satisfies the threshold criterion, performing an error handling operation on the data stored on the source set of memory cells to generate corrected data; and causing the memory device to copy data the corrected data to a destination set of memory cells of the memory device, wherein the destination set of memory cells are configured to store a second number of bits per memory cell, wherein the second number of bits per memory cells is greater than the first number of bits per memory cell.