The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Aug. 21, 2023
Applicant:

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Sandeep Jain, Noida, IN;

Shalini Pathak, Gurgaon, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01);
Abstract

According to an embodiment, a first aspect relates to a method for testing a scan chain. The method includes segmenting the scan chain into two or more segments; adding a respective multiplexer at end points of each segment, wherein each pair of sequential segment shares a common multiplexer in between; asserting a select signal at a select terminal of the multiplexers such that a relative position of the two or more segments is rearranged positionally in a rearranged scan chain; generating a test pattern to be communicated to an input terminal of the rearranged scan chain and observing a test result at an output of the rearranged scan chain; and determining a fault condition in the rearranged scan chain based on comparing the test result and an expected result.


Find Patent Forward Citations

Loading…