The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jun. 01, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Eyal En Gad, Santa Clara, CA (US);

Mustafa N. Kaynak, San Diego, CA (US);

Yoav Weinberg, Toronto, CA;

Zhengang Chen, San Jose, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1128 (2013.01); H03M 13/1108 (2013.01); H03M 13/1117 (2013.01); H03M 13/1151 (2013.01);
Abstract

A processing device in a memory sub-system determines a syndrome weight for a sense word read from a memory device and determines whether the syndrome weight for the sense word satisfies a threshold criterion. Responsive to the syndrome weight for the sense word satisfying a respective threshold criterion associated with a next iteration of a first decoding operation, bypassing the first decoding operation and initiating a second decoding operation for the sense word, wherein the second decoding operation has a higher error correction capability than the first decoding operation.


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