The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Sep. 06, 2019
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Keitarou Tsuchiya, Takasaki, JP;

Kazunori Hagimoto, Takasaki, JP;

Masaru Shinomiya, Annaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02021 (2013.01); H01L 21/02381 (2013.01); H01L 21/0254 (2013.01);
Abstract

A method for manufacturing an epitaxial wafer including the steps of: preparing a silicon-based substrate having a chamfered portion in a peripheral portion; forming an annular trench in the chamfered portion of the silicon-based substrate along an internal periphery of the chamfered portion; and performing an epitaxial growth on the silicon-based substrate having the trench formed. This provides a method for manufacturing an epitaxial wafer by which a crack generated in a peripheral chamfered portion can be suppressed from extending towards the center.


Find Patent Forward Citations

Tsuchiya, Keitarou. (2025). Method for manufacturing epitaxial wafer, silicon-based substrate for epitaxial growth, and epitaxial wafer (U.S. Patent No. 12266520). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12266520

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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