The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Sep. 26, 2023
Applicant:

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Sandeep Jain, Noida, IN;

Akshay Kumar Jain, Bhopal, IN;

Jeena Mary George, Kattappana, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/317 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31901 (2013.01); G01R 31/31701 (2013.01); G01R 31/31932 (2013.01);
Abstract

According to an embodiment, a digital circuit with N number of redundant flip-flops is provided, each having a data input coupled to a common data signal. The digital circuit operates in a functional mode and a test mode. During test mode, a first flip-flop is arranged as part of a test path and N−1 flip-flops are arranged as shadow logic. A test pattern at the common data signal is provided and a test output signal is observed at an output terminal of the first flip-flop to determine faults within a test path of the first flip-flop. At the same cycle, the test output signals of each of the N−1 number of redundant flip-flops is observed through the functional path to determine faults.


Find Patent Forward Citations

Loading…