The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Oct. 20, 2022
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventors:

Lukas Fischer, Schwäbisch Gmünd, DE;

Klaus Gwosch, Aalen, DE;

Markus Koch, Neu-Ulm, DE;

Mario Laengle, Jena, DE;

Daniel Pagel, Essingen, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70266 (2013.01); G03F 7/70308 (2013.01); G03F 7/706 (2013.01);
Abstract

An optical measuring system is used to reproduce a target wavefront of an imaging optical production system when an object is illuminated with illumination light. The optical measuring system comprises an object holder displaceable by actuator means and at least one optical component displaceable by actuator means. Within the scope of the target wavefront reproduction, a starting actuator position set (X), in which each actuator is assigned a starting actuator position, is initially specified. An expected design wavefront (W) which approximates the target wavefront and which the optical measuring system produces as a set wavefront is determined. A coarse measurement of a starting wavefront (W) which the optical measuring system produces as actual wavefront after actually setting the starting actuator position set (X) is carried out. Then, the object holder is adjusted by actuator means until a coarse target wavefront (W) is obtained for a coarse actuator position set (X) in the case of a minimum wavefront deviation between the actual wavefront and the design wavefront (W). Said coarse target wavefront is then subjected to a fine measurement and the at least one optical component is displaced until a fine target wavefront (W) is obtained for a fine actuator position set (X) in the case of a minimum deviation between the actual wavefront setting-in in that case and the design wavefront (W). This reproduction method allows wavefront deviations of the optical measuring system generated by way of targeted misalignment to provide a good approximation of corresponding deviations of the optical production system.


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