The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Jul. 31, 2023
Applicant:
Stmicroelectronics International N.v., Geneva, CH;
Inventors:
Sandeep Jain, Noida, IN;
Shalini Pathak, Gurgaon, IN;
Assignee:
STMicroelectronics International N.V., Geneva, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/317 (2013.01); G01R 31/318335 (2013.01); G01R 31/31853 (2013.01); G01R 31/318533 (2013.01); G01R 31/318555 (2013.01); G01R 31/318558 (2013.01); G01R 31/318566 (2013.01);
Abstract
A method for testing a chip comprising receiving N scan-in chains of test data; using the N scan-in chains of test data to perform tests on the chip; receiving a merged expected test-result and masking-instruction signal on X pins of the chip from the off-chip test equipment, X being less than 2*N; decoding the merged expected test-result and masking-instruction signal to extract N decoded output signals, each of the N decoded output signals corresponding to a respective chain of test results.