The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Jul. 28, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Yi-Jing Lee, Hsinchu, TW;

Ming-Hua Yu, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/02 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 29/167 (2006.01); H01L 29/36 (2006.01); H01L 29/78 (2006.01); H01L 21/28 (2006.01); H01L 21/306 (2006.01); H01L 21/3065 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); H01L 21/02532 (2013.01); H01L 21/02579 (2013.01); H01L 21/0262 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/167 (2013.01); H01L 29/36 (2013.01); H01L 29/66545 (2013.01); H01L 29/6656 (2013.01); H01L 29/66636 (2013.01); H01L 29/7851 (2013.01); H01L 21/28088 (2013.01); H01L 21/30604 (2013.01); H01L 21/3065 (2013.01); H01L 29/4966 (2013.01);
Abstract

A method includes recessing a semiconductor fin to form a recess, wherein the semiconductor fin protrudes higher than isolation regions on opposite sides of the semiconductor fin, and performing a first epitaxy to grow a first epitaxy layer extending into the recess. The first epitaxy is performed using a first process gas comprising a silicon-containing gas, silane, and a phosphorous-containing gas. The first epitaxy layer has a first phosphorous atomic percentage. The method further includes performing a second epitaxy to grow a second epitaxy layer extending into the recess and over the first epitaxy layer. The second epitaxy is performed using a second process gas comprising the silicon-containing gas, silane, and the phosphorous-containing gas. The second epitaxy layer has a second phosphorous atomic percentage higher than the first phosphorous atomic percentage.


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