The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Aug. 29, 2022
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Abu Naser Zainuddin, Milpitas, CA (US);

Jiahui Yuan, Fremont, CA (US);

Dong-Il Moon, San Jose, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 11/56 (2006.01); G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); G11C 16/30 (2006.01); G11C 16/34 (2006.01); G11C 29/12 (2006.01); H01L 23/00 (2006.01); H01L 25/065 (2023.01); H01L 25/18 (2023.01);
U.S. Cl.
CPC ...
G11C 29/12005 (2013.01); G06F 3/0625 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01); G11C 11/5628 (2013.01); G11C 11/5642 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01); G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01); G11C 16/30 (2013.01); G11C 16/3459 (2013.01); H01L 24/08 (2013.01); H01L 25/0657 (2013.01); H01L 25/18 (2013.01); G11C 2029/1202 (2013.01); H01L 2224/08145 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/06562 (2013.01);
Abstract

To reduce spikes in the current used by a NAND memory die, different ramp rates are used for the pass voltage applied to unselected word lines during a program operation depending on whether data is stored in a multi-level cell (MLC) format or in a single level cell (SLC) format. These ramp rates can be determined through device characterization and stored as parameter values on the memory die. Different ramp rate interval values can also be used for the pass voltage applied to unselected word lines during a program operation depending on whether data is stored in an MLC format or in an SLC format.


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