The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Aug. 08, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

James Jeng-Jyi Hwang, Hsin-Chu County, TW;

He Hui Peng, Changhua County, TW;

Jiann Lih Wu, Hsin-Chu, TW;

Chi-Ming Yang, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/304 (2006.01); B24B 1/00 (2006.01); B24B 37/04 (2012.01); B24B 37/20 (2012.01); B24B 53/017 (2012.01); B24B 57/02 (2006.01); H01L 21/321 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
B24B 37/042 (2013.01); B24B 1/00 (2013.01); B24B 37/20 (2013.01); B24B 53/017 (2013.01); B24B 57/02 (2013.01); H01L 21/304 (2013.01); H01L 21/3212 (2013.01); H01L 21/67248 (2013.01);
Abstract

A method for polishing a semiconductor substrate includes the following operations. A semiconductor substrate is received. An abrasive slurry having a first temperature is dispensed to a polishing surface of a polishing pad. The semiconductor substrate is polished. The abrasive slurry have a second temperature is dispensed to the polishing surface of the polishing pad during the polishing of the semiconductor substrate. The second temperature is different from the first temperature.


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