The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Dec. 31, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Debkalpo Das, Tamil Nadu, IN;

Raman K Nurani, Chennai, IN;

Ramachandran Subramanian, Chennai, IN;

Bibhavendra Singh, Lucknow, IN;

Bharath Sundar, Chennai, IN;

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01); H01L 21/70 (2006.01);
U.S. Cl.
CPC ...
G06F 30/33 (2020.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01); H01L 21/702 (2013.01);
Abstract

A method includes obtaining sensor data associated with a deposition process performed in a process chamber to deposit film on a surface of a substrate. The method further includes generating a plurality of physics based outputs using a transformation function and the sensor data. The method further includes mapping the physics based outputs to a training set. The method further includes training a virtual model based on the training set and the sensor data, wherein the virtual model is trained to generate predictive metrology data associated with the film.


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