The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Mar. 16, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Hung-Hua Lin, Taipei, TW;

Chang-Ming Wu, New Taipei, TW;

Chung-Yi Yu, Hsin-Chu, TW;

Ping-Yin Liu, Yonghe, TW;

Jung-Huei Peng, Jhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01); B81B 7/00 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00238 (2013.01); B81B 7/008 (2013.01); B81C 1/00333 (2013.01); H01L 24/09 (2013.01); H01L 24/89 (2013.01); B81B 2207/07 (2013.01); B81C 2201/0132 (2013.01); B81C 2203/0109 (2013.01); B81C 2203/0785 (2013.01); B81C 2203/0792 (2013.01); H01L 2224/091 (2013.01); H01L 2224/80013 (2013.01); H01L 2224/80895 (2013.01);
Abstract

A microelectromechanical system (MEMS) structure and method of forming the MEMS device, including forming a first metallization structure over a complementary metal-oxide-semiconductor (CMOS) wafer, where the first metallization structure includes a first sacrificial oxide layer and a first metal contact pad. A second metallization structure is formed over a MEMS wafer, where the second metallization structure includes a second sacrificial oxide layer and a second metal contact pad. The first metallization structure and second metallization structure are then bonded together. After the first metallization structure and second metallization structure are bonded together, patterning and etching the MEMS wafer to form a MEMS element over the second sacrificial oxide layer. After the MEMS element is formed, removing the first sacrificial oxide layer and second sacrificial oxide layer to allow the MEMS element to move freely about an axis.


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