The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Oct. 14, 2021
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Bo Tao, Singapore, SG;

Li Wang, Singapore, SG;

Ching-Yang Wen, Pingtung County, TW;

Purakh Raj Verma, Singapore, SG;

Zhibiao Zhou, Singapore, SG;

Dong Yin, Nantong, CN;

Gang Ren, Singapore, SG;

Jian Xie, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G11C 17/16 (2006.01); H01L 23/525 (2006.01); H10B 20/20 (2023.01); H10B 20/25 (2023.01);
U.S. Cl.
CPC ...
H01L 27/1207 (2013.01); G11C 17/16 (2013.01); G11C 17/165 (2013.01); H01L 23/5252 (2013.01); H10B 20/20 (2023.02); H10B 20/25 (2023.02);
Abstract

A semiconductor structure includes a semiconductor on insulator (SOI) substrate, a first electrically conductive structure, and a second electrically conductive structure. The SOI substrate includes a base substrate, a buried insulation layer disposed on the base substrate, a semiconductor layer disposed on the buried insulation layer, and a trap rich layer disposed between the buried insulation layer and the base substrate. At least a part of the first electrically conductive structure and at least a part of the second electrically conductive structure are disposed in the trap rich layer. A part of the trap rich layer is disposed between the first electrically conductive structure and the second electrically conductive structure. The first electrically conductive structure, the second electrically conductive structure, and the trap rich layer disposed between the first electrically conductive structure and the second electrically conductive structure are at least a portion of an anti-fuse structure.


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