The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

May. 04, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Yunho Kim, Choes, NY (US);

Yanxiang Shi, Clifton Park, NY (US);

Mingmei Wang, Albany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 37/18 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32266 (2013.01); H01J 37/18 (2013.01); H01J 37/3211 (2013.01); H01J 37/3222 (2013.01); H01J 37/32091 (2013.01); H01J 37/32119 (2013.01); H01J 37/32229 (2013.01); H01J 37/32715 (2013.01); H01J 2237/327 (2013.01); H01J 2237/334 (2013.01); H01L 21/67069 (2013.01);
Abstract

In one example, a plasma processing system includes a vacuum system, a plasma processing chamber including a chamber cavity coupled to the vacuum system, a substrate holder including a surface disposed inside the chamber cavity, a radio frequency (RF) source electrode coupled to an RF power source, the RF source electrode configured to ignite plasma in the chamber cavity. The system includes a microwave source coupled to a microwave oscillator, and a conductive spatial uniformity component including a plurality of through openings, where the conductive spatial uniformity component includes a major surface electromagnetically coupled to the microwave source, the major surface configured to couple microwave power to the plasma in the chamber cavity.


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