The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Mar. 10, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Jeffrey S. McNeil, Nampa, ID (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Patrick R. Khayat, San Diego, CA (US);

Sundararajan Sankaranarayanan, Fremont, CA (US);

Jeremy Binfet, Boise, ID (US);

Akira Goda, Setagaya, JP;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G11C 16/26 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0619 (2013.01); G06F 3/0673 (2013.01); G11C 16/26 (2013.01); G11C 16/0483 (2013.01);
Abstract

A system can include a memory device and a processing device, operatively coupled with the memory device, to perform operations including receiving data to be stored on the memory device, storing a first copy of the data in a first set of memory cells of the memory device, and storing a second copy of the data in a second set of memory cells of the memory device. The operations can also include reading the first copy of the data and determining whether a threshold voltage of a cell in the first set of memory cells is within an overlapping range of voltage distributions, and reading the second copy of the data and determining whether the threshold voltage of a cell in the second set of memory cells is within an overlapping range of voltage distributions. They can also include using the second copy of the data.


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