The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Feb. 24, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Cheng-Ta Wu, Shueishang Township, TW;

Chia-Shiung Tsai, Hsin-Chu, TW;

Jiech-Fun Lu, Madou Township, TW;

Kuo-Hwa Tzeng, Taipei, TW;

Shih-Pei Chou, Tainan, TW;

Yu-Hung Cheng, Tainan, TW;

Yeur-Luen Tu, Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 21/762 (2006.01); H01L 21/02 (2006.01); H01L 29/06 (2006.01); H01L 21/324 (2006.01); H01L 21/66 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 29/408 (2013.01); H01L 21/02238 (2013.01); H01L 21/31111 (2013.01); H01L 21/3247 (2013.01); H01L 21/76254 (2013.01); H01L 22/26 (2013.01); H01L 29/0649 (2013.01);
Abstract

Various embodiments of the present application are directed to a method for forming a thin semiconductor-on-insulator (SOI) substrate without implantation radiation and/or plasma damage. In some embodiments, a device layer is epitaxially formed on a sacrificial substrate and an insulator layer is formed on the device layer. The insulator layer may, for example, be formed with a net charge that is negative or neutral. The sacrificial substrate is bonded to a handle substrate, such that the device layer and the insulator layer are between the sacrificial and handle substrates. The sacrificial substrate is removed, and the device layer is cyclically thinned until the device layer has a target thickness. Each thinning cycle comprises oxidizing a portion of the device layer and removing oxide resulting from the oxidizing.


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