The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Apr. 28, 2022
Applicant:

Nuflare Technology, Inc., Yokohama, JP;

Inventors:

Haruyuki Nomura, Yokohama, JP;

Noriaki Nakayamada, Kamakura, JP;

Munehiro Ogasawara, Hiratsuka, JP;

Assignee:

NuFlare Technology, Inc., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/317 (2006.01); H01J 37/147 (2006.01); H01J 37/302 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3174 (2013.01); H01J 37/147 (2013.01); H01J 37/3026 (2013.01); H01J 37/3045 (2013.01);
Abstract

In a charged particle beam writing method according to one embodiment, a deflector is caused to deflect a charged particle beam and a pattern is written by irradiating a substrate with the charged particle beam. The charged particle beam writing method includes calculating a charge amount distribution based on a charge amount of a beam irradiation region on the substrate immediately after irradiation with the charged particle beam and a diffusion coefficient for electric charge of the substrate, calculating a position shift distribution of the charged particle beam on the substrate based on the charge amount distribution, and correcting an irradiation position of the charged particle beam based on the position shift distribution.


Find Patent Forward Citations

Nomura, Haruyuki. (2023). Charged particle beam writing method, charged particle beam writing apparatus, and computer-readable recording medium (U.S. Patent No. 11804361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11804361

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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