The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2023

Filed:

Jun. 02, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Eyal En Gad, Santa Clara, CA (US);

Zhengang Chen, San Jose, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Yoav Weinberg, Toronto, CA;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); H03M 13/00 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1128 (2013.01); G06F 11/1076 (2013.01);
Abstract

A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.


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