The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jan. 08, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Sho Oikawa, Miyagi, JP;

Seiji Yokoyama, Miyagi, JP;

Taichi Okano, Miyagi, JP;

Shunichi Kawasaki, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01J 37/32 (2006.01); C23C 16/52 (2006.01); H01L 21/66 (2006.01); C23C 14/34 (2006.01); C23C 16/503 (2006.01); C23C 14/54 (2006.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); C23C 14/34 (2013.01); C23C 14/54 (2013.01); C23C 16/503 (2013.01); C23C 16/52 (2013.01); H01J 37/32642 (2013.01); H01J 37/32715 (2013.01); H01J 37/32926 (2013.01); H01L 21/02274 (2013.01); H01J 2237/332 (2013.01); H01J 2237/334 (2013.01); H01J 2237/3321 (2013.01);
Abstract

A method of processing an object using a plasma processing apparatus is provided. The plasma processing apparatus includes a stage on which the object is placed in a chamber, an outer peripheral member disposed around the stage, and a first power supply configured to apply voltage to the outer peripheral member. The method includes a step of exposing the object to a plasma containing a precursor having a deposition property, while applying voltage from the first power supply to the outer peripheral member. In applying voltage to the outer peripheral member, a status of a deposition film containing carbon that is deposited on the outer peripheral member is monitored, and the voltage applied to the outer peripheral member is controlled based on the monitored status of the deposition film.


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