The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Feb. 11, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Pengyuan Zheng, Boise, ID (US);

Enrico Varesi, Milan, IT;

Lorenzo Fratin, Buccinasco, IT;

Dale Collins, Boise, ID (US);

Yongjun J. Hu, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01); C23C 14/06 (2006.01); C23C 14/34 (2006.01); H01L 27/24 (2006.01);
U.S. Cl.
CPC ...
H01L 45/1253 (2013.01); C23C 14/0635 (2013.01); C23C 14/34 (2013.01); H01L 27/2481 (2013.01); H01L 45/06 (2013.01); H01L 45/1233 (2013.01); H01L 45/141 (2013.01); H01L 45/16 (2013.01);
Abstract

Methods, systems, and devices for composite electrode material chemistry are described. A memory device may include an access line, a storage element comprising chalcogenide, and an electrode coupled with the memory element and the access line. The electrode may be made of a composition of a first material doped with a second material. The second material may include a tantalum-carbon compound. In some cases, the second may be operable to be chemically inert with the storage element. The second material may include a thermally stable electrical resistivity and a lower resistance to signals communicated between the access line and the storage element across a range of operating temperatures of the storage element as compared with a resistance of the first material.


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