The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Jan. 30, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Cornelius Brown Peethala, Slingerlands, NY (US);

Hari Prasad Amanapu, Guilderland, NY (US);

Raghuveer Reddy Patlolla, Guilderland, NY (US);

Koichi Motoyama, Clifton Park, NY (US);

Chih-Chao Yang, Glenmont, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 23/522 (2006.01); H01L 21/762 (2006.01); H01L 43/08 (2006.01); H01L 43/12 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76811 (2013.01); H01L 23/5226 (2013.01); H01L 23/5329 (2013.01); H01L 21/762 (2013.01); H01L 43/08 (2013.01); H01L 43/12 (2013.01);
Abstract

Embodiments of the invention include a method of forming a multi-layer integrated circuit (IC) structure that includes forming a first dielectric layer from a first dielectric material. A first conductive interconnect is formed having a first conductive interconnect surface. The first conductive interconnect is positioned in a first portion of the first dielectric layer, and the first conductive interconnect surface has a first conductive interconnect surface area. A second conductive interconnect is formed having a second conductive interconnect surface. The second conductive interconnect is above the first conductive interconnect and positioned in a second portion of the first dielectric layer. The second conductive interconnect surface has a second conductive interconnect surface area that is less than a first conductive interconnect surface area of the first conductive interconnect. A planarization stop region is formed above the second conductive interconnect and in a third portion of the first dielectric layer.


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