The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Jan. 26, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Ivan Nikitin, Regensburg, DE;

Timo Bohnenberger, Neutraubling, DE;

Andreas Grassmann, Regensburg, DE;

Martin Mayer, Nittendorf, DE;

Alexander Roth, Zeitlarn, DE;

Franz Zollner, Sinzing, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/495 (2006.01); H01L 21/48 (2006.01); H01L 21/56 (2006.01); H01L 23/28 (2006.01); H01L 21/00 (2006.01); H01L 23/31 (2006.01); H01L 25/065 (2023.01); H01L 25/07 (2006.01); H01L 23/36 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49568 (2013.01); H01L 21/4825 (2013.01); H01L 21/4871 (2013.01); H01L 21/565 (2013.01); H01L 23/28 (2013.01); H01L 23/3107 (2013.01); H01L 23/3114 (2013.01); H01L 23/36 (2013.01); H01L 23/49503 (2013.01); H01L 23/49562 (2013.01); H01L 24/83 (2013.01); H01L 25/0652 (2013.01); H01L 25/072 (2013.01); H01L 2924/181 (2013.01);
Abstract

A semiconductor package includes a semiconductor die, an encapsulant body of electrically insulating material that encapsulates the semiconductor die, a thermal conduction plate comprising an outer surface that is exposed from the encapsulant body, a region of thermal interface material interposed between the thermal conduction plate and the semiconductor die, the region of thermal interface material being a liquid or semi-liquid, and a barrier that is configured to prevent the thermal interface material of the region from flowing laterally across the barrier.


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