The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Mar. 24, 2021
Applicant:

Kla Corporation, Milpitas, CA (US);

Inventors:

Tomas Plettner, Milpitas, CA (US);

Ernesto Escorcia, Milpitas, CA (US);

Sameet K. Shriyan, San Jose, CA (US);

Jeong Ho Lee, Milpitas, CA (US);

Assignee:

KLA Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/22 (2006.01); G01N 23/2251 (2018.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/226 (2013.01); G01N 23/2251 (2013.01); G01N 2223/6116 (2013.01); G01N 2223/646 (2013.01); H01J 37/28 (2013.01);
Abstract

An aperture array for a multi-beam array system and a method of selecting a subset of a beam from a multi-beam array system are provided. The aperture array comprises an array body arranged proximate to a beam source. The array body comprises a plurality of apertures, at least two of the apertures having different geometries. The array body is movable, via an actuator, relative to an optical axis of the beam source, such that a subset of a beam from the beam source is selected based on the geometry of the aperture that is intersected by the optical axis.


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