The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Mar. 19, 2021
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Li-Chieh Wu, Hsinchu, TW;

Kuo-Hsiu Wei, Tainan, TW;

Kei-Wei Chen, Tainan, TW;

Tang-Kuei Chang, Tainan, TW;

Chia Hsuan Lee, Hsinchu, TW;

Jian-Ci Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/321 (2006.01); C09G 1/04 (2006.01); H01L 23/532 (2006.01); H01L 23/535 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76895 (2013.01); C09G 1/04 (2013.01); H01L 21/3212 (2013.01); H01L 21/7684 (2013.01); H01L 21/76805 (2013.01); H01L 21/76823 (2013.01); H01L 21/76843 (2013.01); H01L 21/76888 (2013.01); H01L 23/535 (2013.01); H01L 23/53266 (2013.01);
Abstract

A structure and a formation method of a semiconductor device are provided. The method includes forming a conductive feature over a semiconductor substrate and forming a dielectric layer over the conductive feature. The method also includes forming an opening in the dielectric layer to expose the conductive feature. The method further includes forming a conductive material to overfill the opening. In addition, the method includes thinning the conductive material using a chemical mechanical polishing process. A slurry used in the chemical mechanical polishing process includes an iron-containing oxidizer that oxidizes a portion of the conductive material.


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