The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Mar. 05, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Yi Heng Tsai, Hsinchu, TW;

Fu-Chun Huang, Hsinchu County, TW;

Ching-Hui Lin, Taichung, TW;

Chun-Ren Cheng, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/27 (2013.01); B81B 7/02 (2006.01); B06B 1/02 (2006.01); B06B 1/06 (2006.01); B81C 3/00 (2006.01); H01L 41/113 (2006.01); H01L 41/29 (2013.01);
U.S. Cl.
CPC ...
H01L 41/27 (2013.01); B06B 1/0292 (2013.01); B06B 1/0666 (2013.01); B81B 7/02 (2013.01); B81C 3/001 (2013.01); H01L 41/1138 (2013.01); H01L 41/29 (2013.01); B81B 2203/0127 (2013.01); B81B 2203/04 (2013.01); B81B 2207/07 (2013.01); B81C 2201/013 (2013.01); B81C 2203/033 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes: forming a first substrate includes a membrane stack over a first dielectric layer, the membrane stack having a first electrode, a second electrode over the first electrode and a piezoelectric layer between the first electrode and the second electrode, a third electrode over the first dielectric layer, and a second dielectric layer over the membrane stack and the third electrode; forming a second substrate, including: a redistribution layer (RDL) over a third substrate, the RDL having a fourth electrode; and a first cavity on a surface of the RDL adjacent to the fourth electrode; forming a second cavity in one of the first substrate and the second substrate; and bonding the first substrate to the second substrate.


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