The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Sep. 03, 2015
Applicant:

Entegris, Inc., Billerica, MA (US);

Inventors:

Philip S. H. Chen, Bethel, CT (US);

William Hunks, Waterbury, CT (US);

Steven Lippy, Brookfield, CT (US);

Ruben Remco Lieten, Leuven, BE;

Assignee:

ENTEGRIS, INC., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/02 (2006.01); H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 21/02 (2006.01); C23C 16/56 (2006.01); C23C 16/04 (2006.01); C23C 16/18 (2006.01); H01L 21/3213 (2006.01); C23C 16/06 (2006.01); C23C 16/455 (2006.01); H01L 23/532 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76879 (2013.01); C23C 16/02 (2013.01); C23C 16/0227 (2013.01); C23C 16/04 (2013.01); C23C 16/06 (2013.01); C23C 16/18 (2013.01); C23C 16/45525 (2013.01); C23C 16/45559 (2013.01); C23C 16/56 (2013.01); H01L 21/02063 (2013.01); H01L 21/28562 (2013.01); H01L 21/32134 (2013.01); H01L 21/76814 (2013.01); H01L 21/76849 (2013.01); H01L 21/76864 (2013.01); H01L 21/76873 (2013.01); H01L 23/53238 (2013.01); H01L 21/31144 (2013.01); H01L 23/53266 (2013.01);
Abstract

A process for forming cobalt on a substrate, comprising: volatilizing a cobalt precursor of the disclosure, to form, a precursor vapor: and contacting the precursor vapor with the substrate under vapor deposition conditions effective for depositing cobalt on the substrate from the precursor vapor, wherein the vapor deposition conditions include temperature not exceeding 200° C., wherein: the substrate includes copper surface and dielectric material, e.g., ultra-low dielectric material. Such cobalt deposition process can be used to manufacture product articles in which the deposited cobalt forms a capping layer, encapsulating layer, electrode, diffusion layer, or seed for electroplating of metal thereon, e.g., a semiconductor device, flat-panel, display, or solar panel. A cleaning composition containing base and oxidizing agent components may be employed to clean the copper prior to deposition of cobalt thereon, to achieve substantially reduced defects in the deposited cobalt.


Find Patent Forward Citations

Chen, Philip S. H.. (2022). Cobalt deposition selectivity on copper and dielectrics (U.S. Patent No. 11476158). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11476158

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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