The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Apr. 14, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kangguo Cheng, Schenectady, NY (US);

Eric Miller, Watervliet, NY (US);

Fee Li Lie, Albany, NY (US);

Gauri Karve, Cohoes, NY (US);

Marc A. Bergendahl, Rensselaer, NY (US);

John Ryan Sporre, Albany, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/423 (2006.01); H02M 3/155 (2006.01); H04L 9/32 (2006.01); H01L 29/06 (2006.01); H04L 9/08 (2006.01); B82Y 10/00 (2011.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); B82Y 10/00 (2013.01); H01L 29/0673 (2013.01); H01L 29/42392 (2013.01); H02M 3/155 (2013.01); H04L 9/0866 (2013.01); H04L 9/3278 (2013.01);
Abstract

Methods, and devices related to authentication of chips using physical unclonable function (PUF) are disclosed. The semiconductor chip includes a substrate. The semiconductor chip includes multiple devices formed on the substrate. Each device includes multiple fins. A gate is formed on the multiple fins with a gate cut (CT) design that results in random distribution of complete gate cut and incomplete gate cut for each of the multiple devices based on a natural process variation in semiconductor manufacturing for each device. A physical unclonable function (PUF) region is defined in accordance with the random distribution.


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