The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Oct. 24, 2019
Applicant:

Tessera, Inc., San Jose, CA (US);

Inventors:

Veeraraghavan S. Basker, Schenectady, NY (US);

Kangguo Cheng, Schenectady, NY (US);

Ali Khakifirooz, Los Altos, CA (US);

Assignee:

TESSERA LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 29/06 (2006.01); H01L 29/423 (2006.01); H01L 21/265 (2006.01); H01L 21/762 (2006.01); H01L 21/306 (2006.01); H01L 29/66 (2006.01); H01L 21/308 (2006.01); H01L 21/311 (2006.01); H01L 21/32 (2006.01); H01L 21/3213 (2006.01); H01L 21/027 (2006.01); H01L 29/78 (2006.01); H01L 21/3115 (2006.01); H01L 21/3215 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823412 (2013.01); H01L 21/0273 (2013.01); H01L 21/26586 (2013.01); H01L 21/3083 (2013.01); H01L 21/30604 (2013.01); H01L 21/30612 (2013.01); H01L 21/31111 (2013.01); H01L 21/32 (2013.01); H01L 21/32134 (2013.01); H01L 21/76224 (2013.01); H01L 21/823431 (2013.01); H01L 21/823481 (2013.01); H01L 27/0886 (2013.01); H01L 29/0653 (2013.01); H01L 29/42364 (2013.01); H01L 29/6681 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 21/31155 (2013.01); H01L 21/3215 (2013.01);
Abstract

An array of semiconductor fins is formed on a top surface of a substrate. A dielectric material liner is formed on the surfaces of the array of semiconductor fins. A photoresist layer is applied and patterned such that sidewalls of an opening in the photoresist layer are parallel to the lengthwise direction of the semiconductor fins, and are asymmetrically laterally offset from a lengthwise direction passing through the center of mass of a semiconductor fin to be subsequently removed. An angled ion implantation is performed to convert a top portion of dielectric material liner into a compound material portion. The compound material portion is removed selective to the remaining dielectric material liner, and the physically exposed semiconductor fin can be removed by an etch or converted into a dielectric material portion by a conversion process. The dielectric material liner can be removed after removal of the semiconductor fin.


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