The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Jan. 22, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alexander Reznicek, Troy, NY (US);

Ruilong Xie, Niskayuna, NY (US);

Kangguo Cheng, Schenectady, NY (US);

Marc A. Bergendahl, Rensselaer, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/417 (2006.01); H01L 29/08 (2006.01); H01L 29/40 (2006.01); H01L 21/20 (2006.01); H01L 21/8234 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 29/6653 (2013.01); H01L 21/2018 (2013.01); H01L 21/823431 (2013.01); H01L 29/0847 (2013.01); H01L 29/401 (2013.01); H01L 29/41791 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 21/31122 (2013.01); H01L 2029/7858 (2013.01);
Abstract

Embodiments of the invention are directed to a method of forming a semiconductor device on an integrated circuit (IC). The method includes forming a containment structure having a non-sacrificial fin-containment region and a sacrificial fin-containment region, wherein the containment structure is configured to define a source or drain (S/D) cavity. A S/D region is formed in the S/D cavity. The S/D region includes a contained S/D region defined by the containment structure. The S/D region further includes a non-contained S/D region positioned above the containment structure. The IC is exposed to an etchant that is selective to the sacrificial fin-containment region, non-selective to the non-sacrificial fin-containment region, and non-selective to a plurality of spacers on the IC. Exposing the IC to the etchant selectively removes the sacrificial fin-containment region and exposes sidewalls of the contained S/D region.


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