The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jul. 29, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Taro Ikeda, Nirasaki, JP;

Mikio Sato, Nirasaki, JP;

Eiki Kamata, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32954 (2013.01); H01J 37/32192 (2013.01); H01J 2237/24507 (2013.01); H01J 2237/24585 (2013.01);
Abstract

A plasma processing apparatus includes a processing chamber, a conductive annular member, a microwave radiating mechanism and a plasma detector. The processing chamber has a ceiling plate with an opening. The conductive annular member is disposed at the opening while being insulated from the ceiling plate. The microwave radiating mechanism is disposed on the ceiling plate to be coaxial with a center of the conductive annular member and configured to radiate microwaves into the processing chamber. Further, a plasma detector is connected to the conductive annular member and configured to detect a state of generated plasma.


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Ikeda, Taro. (2022). Plasma processing apparatus and control method (U.S. Patent No. 11355326). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11355326

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