The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2022

Filed:

Jun. 16, 2017
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Tung-He Chou, Hsinchu, TW;

Hsun-Chung Kuang, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B24B 1/00 (2006.01); C09G 1/02 (2006.01); H01L 21/321 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
B24B 1/005 (2013.01); C09G 1/02 (2013.01); H01L 21/3212 (2013.01); H01L 22/20 (2013.01); H01L 22/12 (2013.01);
Abstract

Present disclosure provides chemical mechanical polishing (CMP) apparatus, including a counterface configured to support a semiconductor wafer at a first surface, a first electromagnet array under the first surface, a polishing head over the counterface and configured to hold the semiconductor wafer at a second surface, and a controller connects to the first electromagnet array. The first electromagnet array comprises a plurality of electromagnets, a polarity of each of the plurality of electromagnets is capable of being individually controlled by the controller. Present disclosure also provides a CMP slurry and a method for using a chemical mechanical polishing apparatus.


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