The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2022

Filed:

Jan. 11, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Scott J. Weber, Piedmont, CA (US);

Sean R. Atsatt, Santa Cruz, CA (US);

Ravi Prakash Gutala, San Jose, CA (US);

Aravind Raghavendra Dasu, Milpitas, CA (US);

Jun Pin Tan, Kuala Lumpur, MY;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 5/02 (2006.01); H03K 19/1776 (2020.01); G11C 5/04 (2006.01); G11C 5/06 (2006.01);
U.S. Cl.
CPC ...
G11C 5/025 (2013.01); G11C 5/04 (2013.01); H03K 19/1776 (2013.01); G11C 5/06 (2013.01);
Abstract

An integrated circuit device may include programmable logic fabric on a first integrated circuit die and sector-aligned memory on a second integrated circuit die to enable large amounts of data to be rapidly processed by a sector of programmable logic of the programmable logic device. The programmable logic fabric may include a first and second sectors. The first sector may be programmed with a circuit design that operates on a first set of data. The sector-aligned memory may include a first sector of sector-aligned memory directly accessible by the first sector of programmable logic fabric and a second sector of sector-aligned memory directly accessible by the second sector of programmable logic fabric. The first sector of sector-aligned memory may store the first set of data.


Find Patent Forward Citations

Loading…