The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2022

Filed:

Oct. 11, 2019
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Toru Ishizuka, Takasaki, JP;

Setsuya Hama, Annaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01); H01L 21/18 (2006.01); H01L 21/322 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76251 (2013.01); H01L 21/324 (2013.01);
Abstract

The present invention is a method for manufacturing a bonded SOI wafer, including: preparing, as a base wafer, a silicon single crystal wafer whose initial interstitial oxygen concentration is 15 ppma or more ('79ASTM); forming a silicon oxide film on a surface of the base wafer by heating the base wafer in an oxidizing atmosphere such that a feeding temperature at which the base wafer is fed into a heat treatment furnace for the heat treatment is 800° C. or more, and the base wafer is heated at the feeding temperature or higher; bonding the base wafer to the bond wafer with the silicon oxide film interposed therebetween; and thinning the bonded bond wafer to form an SOI layer. This provides a method for manufacturing a bonded SOI wafer by a base oxidation method which suppresses the formation of oxide precipitates in a base wafer while suppressing slip dislocation.


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