The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

May. 29, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co. Ltd., Hsinchu, TW;

Inventors:

Yu Shih Wang, Tainan, TW;

Kuo-Bin Huang, Jhubei, TW;

Ming-Hsi Yeh, Hsinchu, TW;

Po-Nan Yeh, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/8238 (2006.01); H01L 21/3213 (2006.01); H01L 23/535 (2006.01); H01L 29/66 (2006.01); H01L 21/28 (2006.01); H01L 27/092 (2006.01); H01L 29/08 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76895 (2013.01); H01L 21/28088 (2013.01); H01L 21/32134 (2013.01); H01L 21/7684 (2013.01); H01L 21/76804 (2013.01); H01L 21/76805 (2013.01); H01L 21/823814 (2013.01); H01L 21/823821 (2013.01); H01L 21/823842 (2013.01); H01L 21/823871 (2013.01); H01L 23/535 (2013.01); H01L 27/0924 (2013.01); H01L 29/0847 (2013.01); H01L 29/4966 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method for forming a semiconductor device includes forming a metal contact on a substrate, forming a first dielectric on the metal contact, forming a first opening in the first dielectric, and performing a wet etch on a bottom surface of the first opening through a first etch stop layer (ESL) over the metal contact. The wet etch forms a first recess in a top surface of the metal contact. An upper width of the first recess is smaller than a lower width of the first recess. A first conductive feature is formed in the first recess and the first opening.


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