The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Nov. 15, 2019
Applicant:

Tessera, Inc., San Jose, CA (US);

Inventors:

Huiming Bu, Glenmont, NY (US);

Kangguo Cheng, Schenectady, NY (US);

Dechao Guo, Niskayuna, NY (US);

Sivananda K. Kanakasabapathy, Pleasanton, CA (US);

Peng Xu, Santa Clara, CA (US);

Assignee:

Tessera, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 29/16 (2006.01); H01L 29/161 (2006.01); H01L 21/8234 (2006.01); H01L 21/8238 (2006.01); H01L 21/84 (2006.01); H01L 21/3065 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 29/785 (2013.01); H01L 21/3065 (2013.01); H01L 21/324 (2013.01); H01L 21/823431 (2013.01); H01L 21/823821 (2013.01); H01L 21/845 (2013.01); H01L 29/0649 (2013.01); H01L 29/0653 (2013.01); H01L 29/1037 (2013.01); H01L 29/16 (2013.01); H01L 29/161 (2013.01); H01L 29/66795 (2013.01); H01L 29/66818 (2013.01); H01L 29/7851 (2013.01);
Abstract

A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, a middle portion, and a bottom substrate portion formed from a same material as an underlying substrate. An oxide layer is formed between the bottom substrate portion of each fin and the isolation layer, with a space between a sidewall of at least a top portion of the isolation dielectric layer and an adjacent sidewall of the one or more fins, above the oxide layer. A gate dielectric, protruding into the space and in contact with the middle portion, is formed over the one or more fins and has a portion formed from a material different from the oxide layer.


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