The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Apr. 13, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Po-Yu Huang, Hsinchu, TW;

Shih-Che Lin, Hsinchu, TW;

Chao-Hsun Wang, Chung-Li, TW;

Kuo-Yi Chao, Hsinchu, TW;

Mei-Yun Wang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 27/088 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 21/8234 (2006.01); H01L 29/417 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5226 (2013.01); H01L 21/76804 (2013.01); H01L 21/76816 (2013.01); H01L 21/76831 (2013.01); H01L 21/76832 (2013.01); H01L 21/76844 (2013.01); H01L 21/76877 (2013.01); H01L 21/76895 (2013.01); H01L 21/823431 (2013.01); H01L 21/823475 (2013.01); H01L 23/5283 (2013.01); H01L 27/0886 (2013.01); H01L 29/41791 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01);
Abstract

A method and structure for forming semiconductor device includes forming a contact via opening in a first dielectric layer, where the contact via opening exposes a first portion of a contact etch stop layer (CESL). The method further includes etching both the first portion of the CESL exposed by the contact via opening and adjacent lateral portions of the CESL to expose a source/drain contact and form an enlarged contact via opening having cavities disposed on either side of a bottom portion of the enlarged contact via opening. The method further includes forming a passivation layer on sidewall surfaces of the enlarged contact via opening including on sidewall surfaces of the cavities. The method further includes depositing a first metal layer within the enlarged contact via opening and within the cavities to provide a contact via in contact with the exposed source/drain contact.


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